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"Robust test generation algorithm for stuck-open fault in CMOS circuits."

Weiwei Mao, Xieting Ling (1986)

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DOI: 10.1145/318013.318051

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/WeiweiX86
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  - https://dblp.org/rec/conf/dac/WeiweiX86
Weiwei Mao, Xieting Ling:
Robust test generation algorithm for stuck-open fault in CMOS circuits. DAC 1986: 236-242

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