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"EffiTest: efficient delay test and statistical prediction for configuring ..."

Grace Li Zhang, Bing Li, Ulf Schlichtmann (2016)

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DOI: 10.1145/2897937.2898017

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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Grace Li Zhang, Bing Li, Ulf Schlichtmann:
EffiTest: efficient delay test and statistical prediction for configuring post-silicon tunable buffers. DAC 2016: 60:1-60:6

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