"Multi-defect real time diagnosis using a single pin probe."

Lubomyr M. Zobniw (1976)

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DOI: 10.1145/800146.804812

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/Zobniw76
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Lubomyr M. Zobniw:
Multi-defect real time diagnosis using a single pin probe. DAC 1976: 179-185

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