"Test generation based diagnosis of device parameters for analog circuits."

Sasikumar Cherubal, Abhijit Chatterjee (2001)

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DOI: 10.1109/DATE.2001.915084

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sasikumar Cherubal, Abhijit Chatterjee:
Test generation based diagnosis of device parameters for analog circuits. DATE 2001: 596-602

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