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"Guilty As Charged: Computational Reliability Threats Posed By ..."

Keven Feng et al. (2019)

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DOI: 10.23919/DATE.2019.8715149

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-20

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  dblp key:
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Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan:
Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. DATE 2019: 156-161

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