"Guilty As Charged: Computational Reliability Threats Posed By ..."

Keven Feng et al. (2019)

> Home

Details and statistics

DOI: 10.23919/DATE.2019.8715149

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/date/FengVJRV19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/FengVJRV19
Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan:
Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. DATE 2019: 156-161

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.