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"EBIST: A Novel Test Generator with Built-In Fault Detection Capability."

Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakrabarty (2003)

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DOI: 10.1109/DATE.2003.1186390

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/date/PradhanLC03
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  persistent URL:
  - https://dblp.org/rec/conf/date/PradhanLC03
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakrabarty:
EBIST: A Novel Test Generator with Built-In Fault Detection Capability. DATE 2003: 10224-10229

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