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"Fast Sequential Circuit Test Generation Using High-Level and Gate-Level ..."
Elizabeth M. Rudnick et al. (1998)
- Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno
, Paolo Prinetto, Matteo Sonza Reorda
:
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques. DATE 1998: 570-576
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