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"Design-Reliability Flow and Advanced Models Address IC-Reliability Issues."

Mohamed Selim, Eric Jeandeau, Cyril Desclèves (2016)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-03-10

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  - electronic edition @ ceur-ws.org (open access)
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  dblp key:
  - conf/date/SelimJD16
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  persistent URL:
  - https://dblp.org/rec/conf/date/SelimJD16
Mohamed Selim, Eric Jeandeau, Cyril Desclèves:
Design-Reliability Flow and Advanced Models Address IC-Reliability Issues. ERMAVSS@DATE 2016: 1-4

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