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"A metamodel-based adaptive sampling approach for efficient failure region ..."

Ingrid Kovacs et al. (2020)

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DOI: 10.1109/DCIS51330.2020.9268659

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-07

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Ingrid Kovacs, Marina Dana Topa, Monica Ene, Andi Buzo, Georg Pelz:
A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits. DCIS 2020: 1-5

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