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"Concurrent Testing of Digital Circuits for Advanced Fault Models."

Santosh Biswas et al. (2006)

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DOI: 10.1109/DDECS.2006.1649612

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ddecs/BiswasMPS06
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  persistent URL:
  - https://dblp.org/rec/conf/ddecs/BiswasMPS06
Santosh Biswas, Siddhartha Mukhopadhyay, P. Patra, Dipankar Sarkar:
Concurrent Testing of Digital Circuits for Advanced Fault Models. DDECS 2006: 204-209

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