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"On test time reduction using pattern overlapping, broadcasting and on-chip ..."
Martin Chloupek, Ondrej Novák, Jiri Jenícek (2012)
- Martin Chloupek, Ondrej Novák, Jiri Jenícek:
On test time reduction using pattern overlapping, broadcasting and on-chip decompression. DDECS 2012: 300-305
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