"An analog perspective on device reliability in 32nm high-κ metal gate ..."

Florian Chouard et al. (2011)

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DOI: 10.1109/DDECS.2011.5783049

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ddecs/ChouardMFS11
Florian Chouard, Shailesh More, Michael Fulde, Doris Schmitt-Landsiedel:
An analog perspective on device reliability in 32nm high-κ metal gate technology. DDECS 2011: 65-70

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