"Test pattern generation for the combinational representation of ..."

Roland Dobai, Elena Gramatová (2010)

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DOI: 10.1109/DDECS.2010.5491759

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Roland Dobai, Elena Gramatová:
Test pattern generation for the combinational representation of asynchronous circuits. DDECS 2010: 323-328

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