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"Evaluation of transition untestable faults using a multi-cycle capture ..."

Masayoshi Yoshimura et al. (2010)

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DOI: 10.1109/DDECS.2010.5491771

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ddecs/YoshimuraOHY10
Masayoshi Yoshimura, Hiroshi Ogawa, Toshinori Hosokawa, Koji Yamazaki:
Evaluation of transition untestable faults using a multi-cycle capture test generation method. DDECS 2010: 273-276

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