"Optimized march test flow for detecting memory faults in SRAM devices ..."

Leonardo Bonet Zordan et al. (2011)

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DOI: 10.1109/DDECS.2011.5783110

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. DDECS 2011: 353-358

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