"Modifying Test Vectors for Reducing Power Dissipation in CMOS Circuits."

Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu (2002)

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DOI: 10.1109/DELTA.2002.994665

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu:
Modifying Test Vectors for Reducing Power Dissipation in CMOS Circuits. DELTA 2002: 431-433

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