"Efficient Critical Area Algorithms and Their Application to Yield ..."

Gerard A. Allan, Anthony J. Walton (1994)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2003-01-24

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Gerard A. Allan, Anthony J. Walton:
Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96

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