"A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with ..."

Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li (2006)

> Home

Details and statistics

DOI: 10.1109/DFT.2006.6

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

- view
  authority control:
- export record
  dblp key:
  - conf/dft/HuangCL06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/HuangCL06
Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li:
A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. DFT 2006: 362-370

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.