"Testing and Defect Tolerance: A Rent's Rule Based Analysis and ..."

Arvind Kumar, Sandip Tiwari (2004)

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DOI: 10.1109/DFT.2004.58

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Arvind Kumar, Sandip Tiwari:
Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics. DFT 2004: 280-288

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