"Test Generation for Single and Multiple Stuck-at Faults of a Combinational ..."

Anjela Yu. Matrosova et al. (2007)

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DOI: 10.1109/DFT.2007.42

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Anjela Yu. Matrosova, Ekaterina Loukovnikova, Sergei Ostanin, Alexandra Zinchuk, Ekaterina Nikolaeva:
Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs. DFT 2007: 206-214

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