"On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled ..."

Nachiket Rajderkar et al. (2011)

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DOI: 10.1109/DFT.2011.51

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Nachiket Rajderkar, Marco Ottavi, Salvatore Pontarelli, Jie Han, Fabrizio Lombardi:
On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS. DFT 2011: 309-315

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