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"On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate ..."

Pelopidas Tsoumanis et al. (2021)

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DOI: 10.1109/DFT52944.2021.9568306

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-22

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  dblp key:
  - conf/dft/TsoumanisPES21
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Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Nestoras E. Evmorfopoulos, George I. Stamoulis:
On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies. DFT 2021: 1-6

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