"Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI."

Arman Vassighi et al. (2002)

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DOI: 10.1109/DFTVS.2002.1173497

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi:
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT 2002: 12-19

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