"Reliability Estimation Model of ICs Interconnect Based on Uniform ..."

Tianxu Zhao et al. (2003)

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DOI: 10.1109/DFTVS.2003.1250090

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-23

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Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma:
Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17

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