"Relation between Reliability and Yield of IC's Based on Discrete Defect ..."

Tianxu Zhao et al. (2001)

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DOI: 10.1109/DFTVS.2001.966751

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-23

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Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen:
Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-

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