"Oxygen Engineering for Positive Bias Stress Stability of Top-Gated Indium ..."

Sumaiya Wahid, Eric Pop (2024)

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DOI: 10.1109/DRC61706.2024.10605526

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-16

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Sumaiya Wahid, Eric Pop:
Oxygen Engineering for Positive Bias Stress Stability of Top-Gated Indium Tin Oxide (ITO) Transistors. DRC 2024: 1-2

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