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"CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity."
Junrui Zhang et al. (2018)
- Junrui Zhang, Francesco Bellando, Maneesha Rupakula, Erick Garcia Cordero, N. Ebejer, J. Longo, Fabien Wildhaber, Hoel Guerin, Adrian Mihai Ionescu:
CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity. DRC 2018: 1-2
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