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"FPGA Software Security Testing Excitation Random Generation Based on SFMEA ..."

Ying-chao Wang et al. (2019)

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DOI: 10.1109/DSA.2019.00074

access: closed

type: Conference or Workshop Paper

metadata version: 2020-05-07

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  dblp key:
  - conf/dsa/WangLCZL19
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Ying-chao Wang, Wei Liu, Peng Chen, Cong Zhang, Chun-jing Li:
FPGA Software Security Testing Excitation Random Generation Based on SFMEA and SFTA. DSA 2019: 465-469

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