"RT Level vs. Microarchitecture-Level Reliability Assessment: Case Study on ..."

Athanasios Chatzidimitriou et al. (2017)

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DOI: 10.1109/DSN-W.2017.16

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Athanasios Chatzidimitriou, Manolis Kaliorakis, Dimitris Gizopoulos, Maurizio Iacaruso, Mauro Pipponzi, Riccardo Mariani, Stefano Di Carlo:
RT Level vs. Microarchitecture-Level Reliability Assessment: Case Study on ARM(R) Cortex(R)-A9 CPU. DSN Workshops 2017: 117-120

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