"DTaint: Detecting the Taint-Style Vulnerability in Embedded Device Firmware."

Kai Cheng et al. (2018)

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DOI: 10.1109/DSN.2018.00052

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-04

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Kai Cheng, Qiang Li, Lei Wang, Qian Chen, Yaowen Zheng, Limin Sun, Zhenkai Liang:
DTaint: Detecting the Taint-Style Vulnerability in Embedded Device Firmware. DSN 2018: 430-441

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