"A Compact Monitoring Circuit to Accurately Extract Fabrication Deviation ..."

Tsuyoshi Horikawa et al. (2020)

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DOI: 10.1109/ECOC48923.2020.9333168

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Tsuyoshi Horikawa, Hideaki Okayama, Yosuke Onawa, Daisuke Shimura, Jun Ushida, Akemi Shiina, Tadashi Murao, Hiroki Yaegashi:
A Compact Monitoring Circuit to Accurately Extract Fabrication Deviation in Silicon Waveguides. ECOC 2020: 1-4

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