"Deep Learning for Printed Mottle Defect Grading."

Jianhang Chen, Qian Lin, Jan P. Allebach (2020)

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DOI: 10.2352/ISSN.2470-1173.2020.8.IMAWM-184

access: open

type: Conference or Workshop Paper

metadata version: 2023-08-01

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  - conf/ei-imawm/ChenLA20
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  - https://dblp.org/rec/conf/ei-imawm/ChenLA20
Jianhang Chen, Qian Lin, Jan P. Allebach:
Deep Learning for Printed Mottle Defect Grading. IMAWM 2020: 1-9

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