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"Improving test-retest reliability of quantitative electroencephalography ..."

Jazmin Suarez-Revelo, John F. Ochoa-Gómez, Jon Duque-Grajales (2016)

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DOI: 10.1109/EMBC.2016.7590861

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-31

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Jazmin Suarez-Revelo, John F. Ochoa-Gómez, Jon Duque-Grajales:
Improving test-retest reliability of quantitative electroencephalography using different preprocessing approaches. EMBC 2016: 961-964

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