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"Conducted immunity of three Op-Amps using the DPI measurement technique ..."

Siham Hairoud et al. (2013)

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DOI: 10.1109/EMCCOMPO.2013.6735172

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-16

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  - conf/emccompo/HairoudDTD13
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Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp:
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. EMC Compo 2013: 53-58

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