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"Exposure model for prediction of number of customer reported defects."

Keld Raaschou, Austen W. Rainer (2008)

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DOI: 10.1145/1414004.1414062

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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  dblp key:
  - conf/esem/RaaschouR08
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  - https://dblp.org/rec/conf/esem/RaaschouR08
Keld Raaschou, Austen W. Rainer:
Exposure model for prediction of number of customer reported defects. ESEM 2008: 306-308

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