"An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk ..."

Mitsuhiko Igarashi et al. (2015)

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DOI: 10.1109/ESSCIRC.2015.7313841

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii:
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology. ESSCIRC 2015: 112-115

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