"Terahertz imaging detectors in a 65-nm CMOS SOI technology."

Erik Öjefors et al. (2010)

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DOI: 10.1109/ESSCIRC.2010.5619749

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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Erik Öjefors, Neda Baktash, Yan Zhao, Richard Al Hadi, Hani Sherry, Ullrich R. Pfeiffer:
Terahertz imaging detectors in a 65-nm CMOS SOI technology. ESSCIRC 2010: 486-489

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