"Circuit-aware device reliability criteria methodology."

Jason T. Ryan et al. (2011)

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DOI: 10.1109/ESSCIRC.2011.6044955

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Jason T. Ryan, Lan Wei, Jason P. Campbell, Ricki G. Southwick, Kin P. Cheung, Anthony S. Oates, H.-S. Philip Wong, John Suehle:
Circuit-aware device reliability criteria methodology. ESSCIRC 2011: 255-258

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