"Electron delay analysis and image charge effect in AlGaN/GaN HEMT on ..."

Alain Agboton et al. (2013)

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DOI: 10.1109/ESSDERC.2013.6818818

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Alain Agboton, Nicolas Defrance, Phillipe Altuntas, Vannessa Avramovic, Adrien Cutivet, Rezky Ouhachi, Jean-Claude de Jaeger, Samira Bouzid-Driad, Hassan Maher, Michel Renvoise, Peter Frijlink:
Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate. ESSDERC 2013: 57-60

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