BibTeX record conf/essderc/BisiSMRCMZ14

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@inproceedings{DBLP:conf/essderc/BisiSMRCMZ14,
  author    = {Davide Bisi and
               Antonio Stocco and
               Matteo Meneghini and
               Fabiana Rampazzo and
               Andrea Cester and
               Gaudenzio Meneghesso and
               Enrico Zanoni},
  title     = {Characterization of high-voltage charge-trapping effects in GaN-based
               power HEMTs},
  booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
               Venice Lido, Italy, September 22-26, 2014},
  pages     = {389--392},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/ESSDERC.2014.6948842},
  doi       = {10.1109/ESSDERC.2014.6948842},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/conf/essderc/BisiSMRCMZ14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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