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"Characterization and Model Validation of Mismatch in Nanometer CMOS at ..."
Pascal Alexander 't Hart et al. (2018)
- Pascal Alexander 't Hart, Jeroen P. G. van Dijk, Masoud Babaie, Edoardo Charbon, Andrei Vladimirescu, Fabio Sebastiano
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Characterization and Model Validation of Mismatch in Nanometer CMOS at Cryogenic Temperatures. ESSDERC 2018: 246-249
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