"Characterization and Model Validation of Mismatch in Nanometer CMOS at ..."

Pascal Alexander 't Hart et al. (2018)

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DOI: 10.1109/ESSDERC.2018.8486859

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-25

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Pascal Alexander 't Hart, Jeroen P. G. van Dijk, Masoud Babaie, Edoardo Charbon, Andrei Vladimirescu, Fabio Sebastiano:
Characterization and Model Validation of Mismatch in Nanometer CMOS at Cryogenic Temperatures. ESSDERC 2018: 246-249

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