"Observation and Analysis of Bit-by-Bit Cell Current Variation During ..."

Kazuki Maeda et al. (2018)

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DOI: 10.1109/ESSDERC.2018.8486913

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-13

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Kazuki Maeda, Shinpei Matsuda, Ken Takeuchi, Ryutaro Yasuhara:
Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM. ESSDERC 2018: 46-49

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