"Impact of Hot Carrier Degradation on the Performances of Current Mirrors ..."

C. Mukherjee et al. (2021)

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DOI: 10.1109/ESSDERC53440.2021.9631828

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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C. Mukherjee, Marine Couret, Cristell Maneux, Didier Céli:
Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. ESSDERC 2021: 251-254

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