"Investigations on current filamentation in PIN diodes using TLP ..."

Patrick Scharf et al. (2019)

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DOI: 10.1109/ESSDERC.2019.8901689

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-28

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Patrick Scharf, Christoph Sohrmann, Steffen Holland, Volkhard Beyer:
Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations. ESSDERC 2019: 226-229

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