"Thin-film SOI PIN-diode leakage current dependence on back-gate-potential ..."

Andrei Schmidt et al. (2015)

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DOI: 10.1109/ESSDERC.2015.7324771

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-02

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Andrei Schmidt, Stefan Dreiner, Holger Vogt, Uwe Paschen:
Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps. ESSDERC 2015: 290-293

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