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"Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash ..."
Shun Suzuki et al. (2018)
- Shun Suzuki, Yoshiaki Deguchi
, Toshiki Nakamura, Ken Takeuchi:
Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-trap and Increase Data-retention Time by 2.7x. ESSDERC 2018: 150-153
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