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"Impact of statistical variability and charge trapping on 14 nm SOI FinFET ..."
Xingsheng Wang et al. (2013)
- Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Jente B. Kuang, Sani R. Nassif, Asen Asenov:
Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability. ESSDERC 2013: 234-237
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