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"Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the ..."
Christoph Wilhelmer et al. (2021)
- Christoph Wilhelmer
, Markus Jech, Dominic Waldhoer
, Al-Moatasem Bellah El-Sayed, Lukas Cvitkovich, Tibor Grasser:
Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network. ESSDERC 2021: 243-246
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