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"A generic approach for detection of wear-out situations in machine subsystems."

Fabian Paschke, Christian Bayer, Olaf Enge-Rosenblatt (2016)

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DOI: 10.1109/ETFA.2016.7733700

access: closed

type: Conference or Workshop Paper

metadata version: 2018-03-31

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  dblp key:
  - conf/etfa/PaschkeBE16
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  - https://dblp.org/rec/conf/etfa/PaschkeBE16
Fabian Paschke, Christian Bayer, Olaf Enge-Rosenblatt:
A generic approach for detection of wear-out situations in machine subsystems. ETFA 2016: 1-4

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