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"Efficient diagnosis technique for aging defects on automotive ..."

Jihun Jung et al. (2015)

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DOI: 10.1109/ETS.2015.7138767

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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  dblp key:
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Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
Efficient diagnosis technique for aging defects on automotive semiconductor chips. ETS 2015: 1-2

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